The atomic force microscope (AFM) is often used to detect specific molecules on the surfaces of specimens1 and to measure a specimen’s mechanical properties2. This information can be deduced from the force-distance curves generated by the deflection of the cantilever as it approaches, indents and recedes from the sample. Force-volume images can be generated from a series of successive force-distance curves recorded while scanning an area of the specimen (Supplementary Fig. 1). This imaging mode has been used since 1997 to image, among others, proteins at molecular resolution, molecular patterns, bacteria, fungi and living cells2. Algorithms for processing force-volume data files have been published3, but there is no universal ready-to-use software for analysis of force-distance curves, and investigators must develop their own custom software.